An oscilloscope and a device under test (DUT) constitute a de-facto system. In it, the most overlooked element is the interface between the two: the oscilloscope’s probes. Test personnel simply grab ...

A capacitor measured with a $100 handheld multi-meter can give a substantially different result than the same capacitor measured with a $10,000 LCR meter. That same capacitor measured with two ...

Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...

Capacitive sensor technology has evolved markedly over recent years, underpinned by advancements in integrated circuit design and novel measurement approaches. These sensors function by detecting ...

Capacitive sensors supply high accuracy at a relatively low cost. But system designers attempting to use them have been forced to first convert the capacitance to a voltage, then convert the voltage ...

With a sampling rate of 50 kHz, the PCap04 capacitive sensing front-end IC from ams achieves a measurement resolution of 8 aF. Designers can configure the device for high resolution, high speed, or ...

AMS has announced a configurable capacitive sensing front end which allows speed and resolution to be traded to optimise designs. Called PCap04, it can capture and digitise 50,000 times per second at ...

During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...