Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Researchers used 1,024 GPUs to run one of the world's largest quantum chemistry circuit simulations, surpassing the 40-qubit ...