Agilent Technologies has announced a strategic partnership with Aster Technologies to enable integration of Aster's TestWay Coverage Analyst with Agilent's printed-circuit-board assembly-test ...

Integration enables companies to prepare designs and implement robust test strategies early in the PCB assembly manufacturing process, enabling earlier defect detection, reduced costs, accelerated ...

The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

Introduction Most software teams measure quality using something called test coverage, a percentage that shows how much of the codebase was touched during testing. The higher the number, the safer the ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

When asked, many engineers will say that the goal of a test plan for a PCB is full or 100% test coverage. When pressed further, they usually admit that 100% test coverage is virtually impossible to ...