A good way to see where this article is headed is to take a look at the screen shot of a demo program shown in Figure 1. The demo sets up a dummy dataset of six items: [ 5.1 3.5 1.4 0.2] [ 5.4 3.9 1.7 ...

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.